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Your search keyword '"SCANNING electron microscopes"' showing total 7 results

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Start Over You searched for: Descriptor "SCANNING electron microscopes" Remove constraint Descriptor: "SCANNING electron microscopes" Search Limiters Peer Reviewed Remove constraint Search Limiters: Peer Reviewed Topic particles (nuclear physics) Remove constraint Topic: particles (nuclear physics) Publication Year Range Last 50 years Remove constraint Publication Year Range: Last 50 years Journal applied physics letters Remove constraint Journal: applied physics letters Publisher american institute of physics Remove constraint Publisher: american institute of physics
7 results on '"SCANNING electron microscopes"'

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1. Frost formation and ice adhesion on superhydrophobic surfaces.

2. Measuring the electrical characteristics of individual junctions in the SnO2 capped ZnO nanowire arrays on Zn substrate.

3. Electron channeling contrast imaging of atomic steps and threading dislocations in 4H-SiC.

4. In situ study of the growth of ZnO nanosheets using environmental scanning electron microscope.

5. Large-scale synthesis and optical behaviors of ZnO tetrapods.

6. Influence of the electron beam on electromigration measurements within a scanning electron microscope.

7. Charging process of polyurethane based composites under electronic irradiation: Effects of cellulose fiber content.

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