Search

The conical diffraction mounting in which the direction of incident light belongs to a plane parallel to the direction of the grooves has the unique property of maintaining high diffraction efficiency, even in the extreme-ultraviolet (EUV) region. This property is useful for designing high-throughput time-delay-compensated monochromators for the spectral selection of ultrashort EUV pulses as the high-order harmonics generated by the interaction between an ultrashort laser pulse and a gas jet. The time compensation allows one to exploit the femtosecond scale duration of the harmonics both to have high intensity and to reach an unprecedented temporal resolution for pump and probe experiments. Because two gratings have to be used for time compensation, the high diffraction efficiency becomes an essential requirement, which can be fulfilled by the conical diffraction mounting. Measurements recently accomplished at the Bending Magnet for Emission Absorption and Reflectivity (BEAR) beam line (ELETTRA Synchrotron, Trieste, Italy) for three gratings in the 10--90 nm region are reported here that show a peak efficiency of as much as 0.7 in the first order. A model computing the electromagnetic propagation and the grating efficiency, implemented and tested with the experimental data, permits the study and design of rather complex systems operating in the conical mounting. Basic physical principles and mathematical aspects of the model are discussed here. OCIS codes: 050.1950, 050.1960, 300.6540, 320.0320.

A Mo-Si multilayer mirror has been used for determination of the ellipticity and higher-order content of a synchrotron beam. The method is based on the angular measure of multilayer reflectivity in the region of Bragg first- and second-order reflections. Beam parameters were derived by a fitting procedure. [C] 2006 Optical Society of America OCIS codes: 120.4140, 340.6720, 310.6860.

The low expected absorption of Ca in the extreme ultraviolet (EUV) makes it an attractive material for multilayers and filters because most materials in nature strongly absorb the EUV. Few optical constant data had been reported for Ca. In this research, Ca films of various thicknesses were deposited on grid-supported C films and their transmittance measured in situ from the visible to the soft x-rays. The measurement range contains M2,3 and L2,3 absorption edges. Transmittance measurements were used to obtain the Ca extinction coefficient k. A minimum k of 0.017 was obtained at ∼23  eV, which makes Ca a promising low-absorption material for EUV coatings. A second spectral range of interest for its low absorption is below the Ca L3 edge at ∼343  eV. Measured k data and extrapolations were used to calculate the refractive index n using Kramers-Krönig relations. This is the first self-consistent data set on Ca covering a wide spectral range including the EUV.