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Polarization and higher-order content measurement of a soft-x-my monochromatized beam with Mo-Si multilayers
- Source :
- Applied Optics. March 20, 2006, Vol. 45 Issue 9, p1985, 8 p.
- Publication Year :
- 2006
-
Abstract
- A Mo-Si multilayer mirror has been used for determination of the ellipticity and higher-order content of a synchrotron beam. The method is based on the angular measure of multilayer reflectivity in the region of Bragg first- and second-order reflections. Beam parameters were derived by a fitting procedure. [C] 2006 Optical Society of America OCIS codes: 120.4140, 340.6720, 310.6860.
- Subjects :
- Ellipsometry -- Research
Astronomy
Physics
Subjects
Details
- Language :
- English
- ISSN :
- 1559128X
- Volume :
- 45
- Issue :
- 9
- Database :
- Gale General OneFile
- Journal :
- Applied Optics
- Publication Type :
- Academic Journal
- Accession number :
- edsgcl.144048096