Author: "Achanta, R." / Journal: 2011 ieee international reliability physics symposium (irps) - Searchworks@Jio Institute Digital Library Search Results

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Your search keyword '"Achanta, R."' showing total 3 results

Start Over Author "Achanta, R." Journal 2011 ieee international reliability physics symposium (irps)

3 results on '"Achanta, R."'

1. A charge transport based acceleration model for interlevel dielectric breakdown.

Author: Achanta, R. and McLaughlin, P.
Published: 2011
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2. Invasion percolation model for abnormal TDDB characteristic of ULK dielectrics with Cu interconnect at advanced technology nodes.

Author: Chen, F., Shinosky, M., Li, B., Aitken, J., Cohen, S., Bonilla, G., Simon, A., McLaughlin, P., Achanta, R., Baumann, F., Parks, C., and Angyal, M.
Published: 2011
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3. Post-breakdown statistics and acceleration characteristics in high-K dielectric stacks.

Author: Wu, E., Sune, J., Linder, B., Achanta, R., Li, B., and Mittl, S.
Published: 2011
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