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Start Over Author "Yuuichi Hirano" Journal 2010 symposium on vlsi technology
1 results on '"Yuuichi Hirano"'

1. Application of a statistical compact model for Random Telegraph Noise to scaled-SRAM Vmin analysis

Author

Takeshi Okagaki, Kenichiro Sonoda, Yuuichi Hirano, O. Tsuchiya, Katsumi Eikyu, Y. Inoue, Motoaki Tanizawa, Shigeki Ohbayashi, and K. Ishikawa

Subjects
business.industry, Computer science, Transistor, Time constant, Electrical engineering, Noise (electronics), law.invention, Distribution (mathematics), law, Random noise, Statistical analysis, Static random-access memory, Statistical physics, business, Sensitivity (electronics)
Abstract

A statistical compact RTN (Random Telegraph Noise) model with a fixed V th shift and V gs dependent trap time constants is proposed. It accurately reproduces the experimental observation of larger V th fluctuation at higher |V gs |. The model is also applied to analysis of SRAM V min fluctuation and finds out the distribution follows a log-normal statistics.

Published
2010

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