1. Development of a High-Rate Front-End ASIC for X-Ray Spectroscopy and Diffraction Applications.
- Author
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Vernon, Emerson, De Geronimo, Gianluigi, Baldwin, Jonathan, Chen, Wei, Fried, Jack, Giacomini, Gabriele, Kuczewski, Anthony, Kuczewski, John, Mead, Joe, Miceli, Antonino, Okasinski, John S., Pinelli, Don, Quaranta, Orlando, Rumaiz, Abdul K., Siddons, Peter, Smith, Graham, Stanacevic, Milutin, and Woods, Russell
- Subjects
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X-ray spectroscopy , *APPLICATION-specific integrated circuits , *X-ray diffraction , *SILICON detectors - Abstract
We developed a new front-end application-specific integrated circuit (ASIC) to upgrade the Maia X-ray microprobe. The ASIC instruments 32 configurable channels that perform either positive or negative charge amplification, pulse shaping, peak amplitude, and time extraction along with buffered analog storage. At a gain of 3.6 V/fC, 1-μ s peaking time, and a temperature of 248 K, an electronic resolution of 13 and 10 e− rms was measured with and without a silicon drift detector (SDD) sensor, respectively. A spectral resolution of 170-eV full-width at half-maximum (FWHM) at 5.9 keV was obtained with an 55Fe source. The channel linearity was better than ± 1 % with rate capabilities up to 40 kcps. The ASIC was fabricated in a commercial 250-nm process with a footprint of 6.3 mm × 3.9 mm and dissipates 167 mW of static power. [ABSTRACT FROM AUTHOR]
- Published
- 2020
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