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Development of a High-Rate Front-End ASIC for X-Ray Spectroscopy and Diffraction Applications.
- Source :
-
IEEE Transactions on Nuclear Science . Apr2020, Vol. 67 Issue 4, p752-759. 8p. - Publication Year :
- 2020
-
Abstract
- We developed a new front-end application-specific integrated circuit (ASIC) to upgrade the Maia X-ray microprobe. The ASIC instruments 32 configurable channels that perform either positive or negative charge amplification, pulse shaping, peak amplitude, and time extraction along with buffered analog storage. At a gain of 3.6 V/fC, 1-μ s peaking time, and a temperature of 248 K, an electronic resolution of 13 and 10 e− rms was measured with and without a silicon drift detector (SDD) sensor, respectively. A spectral resolution of 170-eV full-width at half-maximum (FWHM) at 5.9 keV was obtained with an 55Fe source. The channel linearity was better than ± 1 % with rate capabilities up to 40 kcps. The ASIC was fabricated in a commercial 250-nm process with a footprint of 6.3 mm × 3.9 mm and dissipates 167 mW of static power. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 00189499
- Volume :
- 67
- Issue :
- 4
- Database :
- Academic Search Index
- Journal :
- IEEE Transactions on Nuclear Science
- Publication Type :
- Academic Journal
- Accession number :
- 143316099
- Full Text :
- https://doi.org/10.1109/TNS.2020.2976820