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Development of a High-Rate Front-End ASIC for X-Ray Spectroscopy and Diffraction Applications.

Authors :
Vernon, Emerson
De Geronimo, Gianluigi
Baldwin, Jonathan
Chen, Wei
Fried, Jack
Giacomini, Gabriele
Kuczewski, Anthony
Kuczewski, John
Mead, Joe
Miceli, Antonino
Okasinski, John S.
Pinelli, Don
Quaranta, Orlando
Rumaiz, Abdul K.
Siddons, Peter
Smith, Graham
Stanacevic, Milutin
Woods, Russell
Source :
IEEE Transactions on Nuclear Science. Apr2020, Vol. 67 Issue 4, p752-759. 8p.
Publication Year :
2020

Abstract

We developed a new front-end application-specific integrated circuit (ASIC) to upgrade the Maia X-ray microprobe. The ASIC instruments 32 configurable channels that perform either positive or negative charge amplification, pulse shaping, peak amplitude, and time extraction along with buffered analog storage. At a gain of 3.6 V/fC, 1-μ s peaking time, and a temperature of 248 K, an electronic resolution of 13 and 10 e− rms was measured with and without a silicon drift detector (SDD) sensor, respectively. A spectral resolution of 170-eV full-width at half-maximum (FWHM) at 5.9 keV was obtained with an 55Fe source. The channel linearity was better than ± 1 % with rate capabilities up to 40 kcps. The ASIC was fabricated in a commercial 250-nm process with a footprint of 6.3 mm × 3.9 mm and dissipates 167 mW of static power. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00189499
Volume :
67
Issue :
4
Database :
Academic Search Index
Journal :
IEEE Transactions on Nuclear Science
Publication Type :
Academic Journal
Accession number :
143316099
Full Text :
https://doi.org/10.1109/TNS.2020.2976820