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A Model for Optimal Constrained Adaptive Testing.

Authors :
van der Linden, Wim J.
Reese, Lynda M.
Source :
Applied Psychological Measurement. Sep 1998 22(3):259-270.
Publication Year :
1998

Abstract

Proposes a model for constrained computerized adaptive testing in which the information in the test at the trait level (theta) estimate is maximized subject to the number of possible constraints on the content of the test. Test assembly relies on a linear-programming approach. Illustrates the approach through simulation with items from the Law School Admission Test. (SLD)

Details

Language :
English
ISSN :
0146-6216
Volume :
22
Issue :
3
Database :
ERIC
Journal :
Applied Psychological Measurement
Publication Type :
Academic Journal
Accession number :
EJ594322
Document Type :
Journal Articles<br />Reports - Descriptive