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Opening Through 200 mm Silicon Carbide Epitaxy

Authors :
Michaud, JF
Phung, LV
Alquier, D
Planson, D
Crippa, D
Azadmand, M
Mauceri, M
Preti, S
Puglisi, M
Vecchio, C
Crippa D.
Azadmand M.
Mauceri M.
Preti S.
Puglisi M.
Vecchio C.
Michaud, JF
Phung, LV
Alquier, D
Planson, D
Crippa, D
Azadmand, M
Mauceri, M
Preti, S
Puglisi, M
Vecchio, C
Crippa D.
Azadmand M.
Mauceri M.
Preti S.
Puglisi M.
Vecchio C.
Publication Year :
2022

Abstract

In this paper, the performance of a new CVD reactor (called PE1O8) designed by LPE and developed in the European project REACTION to process uniform 4H-SiC homoepitaxy on 200 mm substrate is reported. Its tunable multi-zone injection system and new gas delivery configuration ensure the uniform gas distribution throughout the substrate. Excellent thickness and doping uniformity on 200 mm substrates are achieved with run-to-run variation less than 1.4% and 5.6% respectively.

Details

Database :
OAIster
Notes :
English
Publication Type :
Electronic Resource
Accession number :
edsoai.on1456739857
Document Type :
Electronic Resource