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A deep learning approach to the automatic detection of alignment errors in cryo-electron tomographic reconstructions

Authors :
Ministerio de Ciencia, Innovación y Universidades (España)
de Isidro-Gómez, F P
Vilas, J L
Losana, P
Carazo, J M
Sorzano, Carlos Óscar S.
Ministerio de Ciencia, Innovación y Universidades (España)
de Isidro-Gómez, F P
Vilas, J L
Losana, P
Carazo, J M
Sorzano, Carlos Óscar S.
Publication Year :
2024

Abstract

Electron tomography is an imaging technique that allows for the elucidation of three-dimensional structural information of biological specimens in a very general context, including cellular in situ observations. The approach starts by collecting a set of images at different projection directions by tilting the specimen stage inside the microscope. Therefore, a crucial preliminary step is to precisely define the acquisition geometry by aligning all the tilt images to a common reference. Errors introduced in this step will lead to the appearance of artifacts in the tomographic reconstruction, rendering them unsuitable for the sample study. Focusing on fiducial-based acquisition strategies, this work proposes a deep-learning algorithm to detect misalignment artifacts in tomographic reconstructions by analyzing the characteristics of these fiducial markers in the tomogram. In addition, we propose an algorithm designed to detect fiducial markers in the tomogram with which to feed the classification algorithm in case the alignment algorithm does not provide the location of the markers. This open-source software is available as part of the Xmipp software package inside of the Scipion framework, and also through the command-line in the standalone version of Xmipp.

Details

Database :
OAIster
Notes :
English
Publication Type :
Electronic Resource
Accession number :
edsoai.on1442726746
Document Type :
Electronic Resource