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Remote epitaxial interaction through graphene

Authors :
Chang, Celesta S
Kim, Ki Seok
Park, Bo-In
Choi, Joonghoon
Kim, Hyunseok
Jeong, Junseok
Barone, Matthew
Parker, Nicholas
Lee, Sangho
Zhang, Xinyuan
Lu, Kuangye
Suh, Jun Min
Kim, Jekyung
Lee, Doyoon
Han, Ne Myo
Moon, Mingi
Lee, Yun Seog
Kim, Dong-Hwan
Schlom, Darrell G
Hong, Young Joon
Kim, Jeehwan
Chang, Celesta S
Kim, Ki Seok
Park, Bo-In
Choi, Joonghoon
Kim, Hyunseok
Jeong, Junseok
Barone, Matthew
Parker, Nicholas
Lee, Sangho
Zhang, Xinyuan
Lu, Kuangye
Suh, Jun Min
Kim, Jekyung
Lee, Doyoon
Han, Ne Myo
Moon, Mingi
Lee, Yun Seog
Kim, Dong-Hwan
Schlom, Darrell G
Hong, Young Joon
Kim, Jeehwan
Source :
American Association for the Advancement of Science
Publication Year :
2024

Abstract

The concept of remote epitaxy involves a two-dimensional van der Waals layer covering the substrate surface, which still enable adatoms to follow the atomic motif of the underlying substrate. The mode of growth must be carefully defined as defects, e.g., pinholes, in two-dimensional materials can allow direct epitaxy from the substrate, which, in combination with lateral epitaxial overgrowth, could also form an epilayer. Here, we show several unique cases that can only be observed for remote epitaxy, distinguishable from other two-dimensional material-based epitaxy mechanisms. We first grow BaTiO <jats:sub>3</jats:sub> on patterned graphene to establish a condition for minimizing epitaxial lateral overgrowth. By observing entire nanometer-scale nuclei grown aligned to the substrate on pinhole-free graphene confirmed by high-resolution scanning transmission electron microscopy, we visually confirm that remote epitaxy is operative at the atomic scale. Macroscopically, we also show variations in the density of GaN microcrystal arrays that depend on the ionicity of substrates and the number of graphene layers.

Details

Database :
OAIster
Journal :
American Association for the Advancement of Science
Notes :
application/pdf, English
Publication Type :
Electronic Resource
Accession number :
edsoai.on1434012151
Document Type :
Electronic Resource