Characterization at the nanometer scale of local electron beam irradiation of CNT based devices

MLA

European Commission, et al. Characterization at the Nanometer Scale of Local Electron Beam Irradiation of CNT Based Devices. 2008. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsoai&AN=edsoai.on1431958998&authtype=sso&custid=ns315887.

APA

European Commission, Ministerio de Economía y Competitividad (España), Rius Suñé, G., Verdaguer, A., Chaves, F. A., Martín-Fernández, I., Godignon, P., Lora-Tamayo D, O. E., Jiménez, D., & Perez Murano, F. X. (2008). Characterization at the nanometer scale of local electron beam irradiation of CNT based devices.

Chicago

European Commission, Ministerio de Economía y Competitividad (España), Gemma Rius Suñé, Albert Verdaguer, Ferney Alveiro Chaves, I. Martín-Fernández, Philippe Godignon, Ocón, Emilio Lora-Tamayo D, David Jiménez, and Francesc X. Perez Murano. 2008. “Characterization at the Nanometer Scale of Local Electron Beam Irradiation of CNT Based Devices.” http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsoai&AN=edsoai.on1431958998&authtype=sso&custid=ns315887.