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Ferroelectricity in layered bismuth oxide down to 1 nanometer

Authors :
National Natural Science Foundation of China
National Key Research and Development Program (China)
Fundamental Research Funds for the Central Universities (China)
Chinese Academy of Sciences
Beijing Municipal Natural Science Foundation
Yang, Qianqian
Hu, Jingcong
Fang, Yue-Wen
Jia, Yueyang
Yang, Rui
Deng, Shiqing
Lu, Yue
Diéguez, Oswaldo
Fan, Longlong
Zheng, Dongxing
Zhang, Xixiang
Dong, Yongqi
Luo, Zhenlin
Wang, Zhen
Wang, Huanhua
Sui, Manling
Xing, Xianran
Chen, Jun
Tian, Jianjun
Zhang, Linxing
National Natural Science Foundation of China
National Key Research and Development Program (China)
Fundamental Research Funds for the Central Universities (China)
Chinese Academy of Sciences
Beijing Municipal Natural Science Foundation
Yang, Qianqian
Hu, Jingcong
Fang, Yue-Wen
Jia, Yueyang
Yang, Rui
Deng, Shiqing
Lu, Yue
Diéguez, Oswaldo
Fan, Longlong
Zheng, Dongxing
Zhang, Xixiang
Dong, Yongqi
Luo, Zhenlin
Wang, Zhen
Wang, Huanhua
Sui, Manling
Xing, Xianran
Chen, Jun
Tian, Jianjun
Zhang, Linxing
Publication Year :
2023

Abstract

Atomic-scale ferroelectrics are of great interest for high-density electronics, particularly field-effect transistors, low-power logic, and nonvolatile memories. We devised a film with a layered structure of bismuth oxide that can stabilize the ferroelectric state down to 1 nanometer through samarium bondage. This film can be grown on a variety of substrates with a cost-effective chemical solution deposition. We observed a standard ferroelectric hysteresis loop down to a thickness of ~1 nanometer. The thin films with thicknesses that range from 1 to 4.56 nanometers possess a relatively large remanent polarization from 17 to 50 microcoulombs per square centimeter. We verified the structure with first-principles calculations, which also pointed to the material being a lone pair-driven ferroelectric material. The structure design of the ultrathin ferroelectric films has great potential for the manufacturing of atomic-scale electronic devices.

Details

Database :
OAIster
Notes :
English
Publication Type :
Electronic Resource
Accession number :
edsoai.on1431958002
Document Type :
Electronic Resource