Multiwavelength exploration of Extreme Emission Line Galaxies detected in miniJPAS survey

Extreme Emission Line Galaxies (EELGs) stand as remarkable objects due to their extremely metal poor environment and intense star formation. Considered as local analogues of high-redshift galaxies in the peak of their star-forming activity, they offer insights into conditions prevalent during the early Universe. Assessment of their stellar and gas properties is, therefore, of critical importance, which requires the assembly of a considerable sample, comprehending a broad redshift range. The Javalambre-Physics of the Accelerating Universe Astrophysical Survey (JPAS) plays a significant role in assembling such a sample, encompassing approximately 8000 deg2 and employing 54 narrow-band optical filters. The present work describes the development and subsequent application of the tools that will be employed in the forthcoming JPAS spectrophotometric data, allowing for the massive and automated characterization of EELGs that are expected to be identified. This fully automated pipeline (requiring only the object coordinates from users) constructs Spectral Energy Distributions (SEDs) by retrieving virtually all the available multi-wavelength photometric data archives, employs SED fitting tools and identifies optical emission lines. It was applied to the sample of extreme line emitters identified in the miniJPAS Survey, and its derived physical properties such as stellar mass and age, coupled with fundamental relations, mirror results obtained through spectral modeling of SDSS spectra. Thorough testing using galaxies with documented photometric measurements across different wavelengths confirmed the pipeline's accuracy, demonstrating its capability for automated analysis of sources with varying characteristics, spanning brightness, morphology, and redshifts. The modular nature of this pipeline facilitates any addition from the user.
Comment: 15 pages, 9 Figures, accepted for publication in MNRAS