Cite
TEM study of basal-plane inversion boundaries in Sn‐Doped ZnO
MLA
Ribić, Vesna, et al. “TEM Study of Basal-Plane Inversion Boundaries in Sn‐Doped ZnO.” 13th Multinational Congress on Microscopy, Rovinj, Croatia, 2017, 2017. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsoai&AN=edsoai.on1420270907&authtype=sso&custid=ns315887.
APA
Ribić, V., Rečnik, A., Dražić, G., Komelj, M., kokalj, A., Podlogar, M., Daneu, N., Bernik, S., Radošević, T., Luković Golić, D., Branković, Z., & Branković, G. (2017). TEM study of basal-plane inversion boundaries in Sn‐Doped ZnO. 13th Multinational Congress on Microscopy, Rovinj, Croatia, 2017.
Chicago
Ribić, Vesna, Aleksander Rečnik, Goran Dražić, Matej Komelj, Anton kokalj, Matejka Podlogar, Nina Daneu, et al. 2017. “TEM Study of Basal-Plane Inversion Boundaries in Sn‐Doped ZnO.” 13th Multinational Congress on Microscopy, Rovinj, Croatia, 2017. http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsoai&AN=edsoai.on1420270907&authtype=sso&custid=ns315887.