Developing methods to tackle analytical issues in battery recycling materials using SEM and bulk analytical methods

To close the loop of the respective material demands, the role of battery recycling is steadily increasing, especially in the light of changing mobility. The analytical requirements for the battery material are challenging, since they are complex and heterogeneous secondary materials. They contain Li in different compounds, carbon in the form of graphite (“black mass”), but also metals like Mn, Fe, Cu, Al, Co, Ni etc. partly in several oxidation states (pure metal foils vs. different compounds). All these components are also highly affected by the recycling stages (e.g. pyrolysis, leaching, ect.). On the other hand, with the main aim of an effective recycling the demand for as detailed as possible analytical data is likewise high. Generally, there is no single method available for tackling all the analytical issues and a combination of methods is inevitable. In different recycling projects, we developed methods for scanning electron microscope (SEM) techniques (in our case MLA mineral liberation analyser and TIMA Tescan integrated mineral analyzer), quantitative XRD (X-ray diffraction) and XRF (X-ray fluorescence) with support of ICP-OES. While SEM techniques are essential to provide information on a particle base (incl. chemical composition, grain size, liberation etc.) the other techniques provide pure bulk chemical analytics. An approach – with slight amendments – known from the so called automated mineralogy applied to the materials revealed very useful results for understanding processing parameters, i.e. for the beneficiation of black mass in high quality (Vanderbruggen et al. 2021). On the other hand by simply adding an internal standard (we chose ZrO2) it is possible to develop a quick and easy method for XRF analysis where the sum of “invisible” elements (e.g. C, Li, O, F) can be determined easily with accurate quantification of the other elements, mainly focusing on the metal contents. Lithium containing compounds can be detected by XRD, but the methods ha