X-Ray reflectivity of fibonacci multilayers

© Elsevier. This work has been supported by UCM under project PR161/93-4811.
We have numerically computed the reflectivity of X-rays incident normally onto Fibonacci multilayers, and compared the results with those obtained in periodic approximant multilayers. The constituent layers are of low and high refractive indices with the same thickness. Whereas the reflectivity of periodic approximant multilayers changes only slightly with increasing the number of layers, Fibonacci multilayers present a completely different behaviour. In particular, we have found a highly fragmented and self-similar reflectivity pattern in Fibonacci systems. The behaviour of the fragmentation pattern on increasing the number of layers is quantitatively described using multifractal techniques. We end with a brief discussion on possible practical applications of our results in the design of new X-ray devices.
UCM
Depto. de Física de Materiales
Fac. de Ciencias Físicas
TRUE
pub