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A meta-meta-analysis of co-infection, secondary infections, and antimicrobial resistance in COVID-19 patients

Authors :
Suleiman, Adeiza Shuaibu
Islam, Md Aminul
Akter, Mir Salma
Amin, Mohammad Ruhul
Werkneh, Adhena Ayaliew
Bhattacharya, Prosun
Suleiman, Adeiza Shuaibu
Islam, Md Aminul
Akter, Mir Salma
Amin, Mohammad Ruhul
Werkneh, Adhena Ayaliew
Bhattacharya, Prosun
Publication Year :
2023

Abstract

The newly discovered coronavirus SARS-CoV-2 has sparked a worldwide pandemic of COVID-19, which has caused havoc on medical infrastructures, economies, and cultures around the world. Determining the whole scenario is essential since SARS-CoV-2 variants and sub-variants keep appearing after vaccinations and booster doses. The objective of this secondary meta-analysis is to analysis co-infection, secondary infections, and antimicrobial resistance (AMR) in COVID-19 patients. This study used five significant databases to conduct a systematic review and an overlap meta-analysis to evaluate the pooled estimates of co-infections and secondary infections. The summary of the meta-analysis showed an overall co-infection effect of 26.19% (95% confidence intervals CI: 21.39–31.01, I2 =98.78, n = 14 meta-analysis) among patients with COVID-19. A coinfection effect of 11.13% (95% CI: 9.7–12.56, I2 =99.14, n = 11 meta-analysis) for bacteria; 9.69% (95% CI: 1.21–7.90, I2 =98.33) for fungal and 3.48% (95% CI: 2.15–4.81, I2 =95.84) for viruses. A secondary infection effect of 19.03% (95% CI: 9.53–28.54, I2 =85.65) was pooled from 2 meta-analyses (Ave: 82 primary studies). This is the first study that compiles the results of all the previous three years meta-analyses into a single source and offers strong proof of co-infections and secondary infections in COVID-19 patients. Early detection of co-infection and AMR is crucial for COVID-19 patients in order to effective treatment.<br />QC 20230831

Details

Database :
OAIster
Notes :
English
Publication Type :
Electronic Resource
Accession number :
edsoai.on1400072204
Document Type :
Electronic Resource
Full Text :
https://doi.org/10.1016.j.jiph.2023.07.005