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Optical and morphological characterization of nanostructured AgO thin films
- Publication Year :
- 2023
-
Abstract
- Silver oxide (AgO) thin films were prepared by using a cylindrical direct current reactive magnetron sputtering system at 10−5 torr initial pressure on BK7 glass substrate. Samples deposited for 3, 5 and 7 minutes. Surface characterization of AgO thin films in the nanometer scale can be accurately determined using the atomic force microscopy (AFM) and X-ray diffraction (XRD). The average roughness (Ravg), maximum peak to valley height (Rt) and root mean square (Rrms) roughness are used to analyze the surface morphology of AgO films. The linear optical absorption data were measured in the visible-near infrared spectral regions and the nonlinear refractive index (n2) of thin films is evaluated by the moiré deflectometery technique. The investigation indicates that, increase in AgO thickness leads to reduction in nonlinear refractive index.<br />Green Open Access added to TU Delft Institutional Repository ‘You share, we take care!’ – Taverne project https://www.openaccess.nl/en/you-share-we-take-care Otherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public.<br />ImPhys/Menzel group
Details
- Database :
- OAIster
- Notes :
- Rad, Adeleh Granmayeh (author), Abbasi, H. (author)
- Publication Type :
- Electronic Resource
- Accession number :
- edsoai.on1398447283
- Document Type :
- Electronic Resource
- Full Text :
- https://doi.org/10.30495.jtap.172304