Cite
Understanding metric-related pitfalls in image analysis validation
MLA
Reinke, Annika, et al. Understanding Metric-Related Pitfalls in Image Analysis Validation. 2023. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsoai&AN=edsoai.on1381599729&authtype=sso&custid=ns315887.
APA
Reinke, A., Tizabi, M. D., Baumgartner, M., Eisenmann, M., Heckmann-Nötzel, D., Kavur, A. E., Rädsch, T., Sudre, C. H., Acion, L., Antonelli, M., Arbel, T., Bakas, S., Benis, A., Blaschko, M., Buettner, F., Cardoso, M. J., Cheplygina, V., Chen, J., Christodoulou, E., … Maier-Hein, L. (2023). Understanding metric-related pitfalls in image analysis validation.
Chicago
Reinke, Annika, Minu D. Tizabi, Michael Baumgartner, Matthias Eisenmann, Doreen Heckmann-Nötzel, A. Emre Kavur, Tim Rädsch, et al. 2023. “Understanding Metric-Related Pitfalls in Image Analysis Validation.” http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsoai&AN=edsoai.on1381599729&authtype=sso&custid=ns315887.