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Dynamics of Hydrogen Isotope Absorption and Emission of Neutron-Irradiated Tungsten

Authors :
TOYAMA, Takeshi
YAJIMA, Miyuki
OHNO, Noriyasu
KUWABARA, Tatsuya
ALIMOV, Vladimir Kh.
HATANO, Yuji
TOYAMA, Takeshi
YAJIMA, Miyuki
OHNO, Noriyasu
KUWABARA, Tatsuya
ALIMOV, Vladimir Kh.
HATANO, Yuji
Publication Year :
2022

Abstract

This overview presents recent results regarding hydrogen isotope absorption and emission dynamics in neutron-irradiated tungsten (W) using our recently developed Compact Diverter Plasma Simulator (CDPS), a linear plasma device in a radiation-controlled area. Neutron irradiation to 0.016 - 0.06 displacement per atom resulted in a significant increase in deuterium (D) retention due to trapping effects of radiation-induced defects. We analyzed the dependency of D retention on the D plasma fluence by exposing neutron-irradiated pure W to D plasma at 563 K over a range of D fluence values. The total retention was revealed to be proportional to the square root of D fluence, indicating that the implanted D atoms first occupy the defects caused by neutron-irradiation near the surface and then the defects located in deeper regions. We further investigated the effects of post-plasma annealing on D emission; neutron-irradiated pure W was exposed to D plasma at 573 K and was then annealed at the same temperature for 30 hours. Approximately 10% of the absorbed D was released by annealing, suggesting that a heat treatment of the plasma-facing component of a fusion reactor at moderately elevated temperatures could contribute to the removal of accumulated hydrogen isotopes. The experimental results obtained in this study were only available by investigating neutron-irradiated specimens with the CDPS system, which will be essential for future studies of material behavior and plasma-wall interactions in the fusion reactor environment.<br />source:https://doi.org/10.1585/pfr.15.1505081

Details

Database :
OAIster
Notes :
English
Publication Type :
Electronic Resource
Accession number :
edsoai.on1375191741
Document Type :
Electronic Resource