Development of incident X-ray flux monitor for coherent X-ray diffraction microscopy

Takahashi Y., Kubo H., Furukawa H., et al. Development of incident X-ray flux monitor for coherent X-ray diffraction microscopy. Journal of Physics: Conference Series, 186, , 012060. https://doi.org/10.1088/1742-6596/186/1/012060.
9TH INTERNATIONAL CONFERENCE ON X-RAY MICROSCOPY 21–25 July 2008, Zürich, Switzerland
An incident X-ray flux monitor for coherent X-ray diffraction microscopy was developed. The intensities of x-rays passing through the sample were measured using an X-ray photodiode, with the simultaneous measurement of the X-ray diffraction intensities of the sample. As a result of the normalization of the X-ray diffraction intensities by the incident X-ray flux determined from the monitor, the fluctuation of the speckle intensities was successfully suppressed. © 2009 IOP Publishing Ltd.