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Beyond Benchmarks : Spotting Key Topical Sentences While Improving Automated Essay Scoring Performance with Topic-Aware BERT

Authors :
Wu, Yongchao
Henriksson, Aron
Nouri, Jalal
Duneld, Martin
Li, Xiu
Wu, Yongchao
Henriksson, Aron
Nouri, Jalal
Duneld, Martin
Li, Xiu
Publication Year :
2023

Abstract

Automated Essay Scoring (AES) automatically allocates scores to essays at scale and may help teachers reduce the heavy burden during grading activities. Recently, researchers have deployed neural-based AES approaches to improve upon the state-of-the-art AES performance. These neural-based AES methods mainly take student essays as the sole input and focus on learning the relationship between student essays and essay scores through deep neural networks. However, their only product, the predicted holistic score, is far from providing adequate pedagogical information, such as automated writing evaluation (AWE). In this work, we propose Topic-aware BERT, a new method of learning relations among scores, student essays, as well as topical information in essay instructions. Beyond improving the AES benchmark performance, Topic-aware BERT can automatically retrieve key topical sentences in student essays by probing self-attention maps in intermediate layers. We evaluate the performance of Topic-aware BERT of different variants to (i) perform AES and (ii) retrieve key topical sentences using the open dataset Automated Student Assessment Prize and a manually annotated dataset. Our experiments show that Topic-aware BERT achieves a strong AES performance compared with the previous best neural-based AES methods and demonstrates effectiveness in identifying key topical sentences in argumentative essays.<br />This article belongs to the Special Issue Artificial Intelligence Solutions and Applications for Distributed Systems in Smart Spaces

Details

Database :
OAIster
Notes :
application/pdf, English
Publication Type :
Electronic Resource
Accession number :
edsoai.on1372248160
Document Type :
Electronic Resource
Full Text :
https://doi.org/10.3390.electronics12010150