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Dose Rate Considerations for Semiconductor Electronics: Why Current Variations Enable Unique GaN-based Transmission Electron Microscopy
- Source :
- Microscopy and Microanalysis; vol 26, iss S2, 3064-3066; 1431-9276
- Publication Year :
- 2020
Details
- Database :
- OAIster
- Journal :
- Microscopy and Microanalysis; vol 26, iss S2, 3064-3066; 1431-9276
- Notes :
- application/pdf, Microscopy and Microanalysis vol 26, iss S2, 3064-3066 1431-9276
- Publication Type :
- Electronic Resource
- Accession number :
- edsoai.on1367477597
- Document Type :
- Electronic Resource