Reliability of Semiconductor and Gas-Filled Diodes for Over-Voltage Protection Exposed to Ionizing Radiation

MLA

Stanković, Koviljka, et al. “Reliability of Semiconductor and Gas-Filled Diodes for Over-Voltage Protection Exposed to Ionizing Radiation.” Nuclear Technology and Radiation Protection, 2009. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsoai&AN=edsoai.on1363254522&authtype=sso&custid=ns315887.

APA

Stanković, K., Vujisić, M. L., & Dolicanin, E. (2009). Reliability of Semiconductor and Gas-Filled Diodes for Over-Voltage Protection Exposed to Ionizing Radiation. Nuclear Technology and Radiation Protection.

Chicago

Stanković, Koviljka, Miloš Lj. Vujisić, and Edin Dolicanin. 2009. “Reliability of Semiconductor and Gas-Filled Diodes for Over-Voltage Protection Exposed to Ionizing Radiation.” Nuclear Technology and Radiation Protection. http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsoai&AN=edsoai.on1363254522&authtype=sso&custid=ns315887.