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Electronic and transport properties of a biased multilayer hexagonal boron nitride

Authors :
Tang, K.
Ni, Z.Y.
Liu, Qihang
Quhe, Ruge
Zheng, Qiye
Zheng, Jiaxin
Fei, R.X.
Gao, Zhengxiang
Lu, Jing
Tang, K.
Ni, Z.Y.
Liu, Qihang
Quhe, Ruge
Zheng, Qiye
Zheng, Jiaxin
Fei, R.X.
Gao, Zhengxiang
Lu, Jing
Publication Year :
2012

Abstract

We explore the electronic and transport properties out of a biased multilayer hexagonal boron nitride (h-BN) by first-principles calculations. The band gaps of multilayer h-BN decrease almost linearly with increasing perpendicular electric field, irrespective of the layer number N and stacking manner. The critical electric filed (E 0) required to close the band gap decreases with the increasing N and can be approximated by E 0 = 3.2 / (N − 1) (eV). We provide a quantum transport simulation of a dual-gated 4-layer h-BN with graphene electrodes. The transmission gap in this device can be effectively reduced by double gates, and a high on-off ratio of 3000 is obtained with relatively low voltage. This renders biased MLh-BN a promising channel in field effect transistor fabrication.

Details

Database :
OAIster
Notes :
English
Publication Type :
Electronic Resource
Accession number :
edsoai.on1363078186
Document Type :
Electronic Resource