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High-resolution multidimensional displacement monitoring system

Authors :
Lee, Neville Ka-shek
Cai, YM
Joneja, Ajay
Lee, Neville Ka-shek
Cai, YM
Joneja, Ajay
Publication Year :
1997

Abstract

The possibility of using quadrant detectors to develop a new optical system that can monitor all six degrees of freedom of mechanical workpieces with very high resolution is investigated. A prototype system based on this approach has been designed and built. Although the system is not fully optimized, our proposed system has already demonstrated some promising results. Using a thermally compensated laser source together with a pinhole spatial filtering system, we have demonstrated that lateral resolution better than 50 nm and angular displacement resolution better than 0.25 mu rad is achievable with this system. (C) 1997 Society of Photo-Optical Instrumentation Engineers.

Details

Database :
OAIster
Notes :
English
Publication Type :
Electronic Resource
Accession number :
edsoai.on1362995438
Document Type :
Electronic Resource