Cite
Electrical and thermal failure modes of 600 V p-gate GaN HEMTs
MLA
Oeder, Thorsten, et al. Electrical and Thermal Failure Modes of 600 V P-Gate GaN HEMTs. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsoai&AN=edsoai.on1358474445&authtype=sso&custid=ns315887. Accessed 16 Jan. 2025.
APA
Oeder, T., Castellazzi, A., & Pfost, M. (n.d.). Electrical and thermal failure modes of 600 V p-gate GaN HEMTs.
Chicago
Oeder, Thorsten, Alberto Castellazzi, and Martin Pfost. 2025. “Electrical and Thermal Failure Modes of 600 V P-Gate GaN HEMTs.” Accessed January 16. http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsoai&AN=edsoai.on1358474445&authtype=sso&custid=ns315887.