Measurement of strain in the InGaN/GaN heterogeneous nanostructures

Authors :: Stankevic, Tomas
Mickevicius, S.
Nielsen, Mikkel Schou
Feidenhans'l, Robert Krarup
Kryliouk, Olga
Ciechonski, Rafal
Vescovi, Giuliano
Bi, Z.
Mikkelsen, Anders
Samuelsen, Lars
Gundlach, Carsten
Stankevic, Tomas
Mickevicius, S.
Nielsen, Mikkel Schou
Feidenhans'l, Robert Krarup
Kryliouk, Olga
Ciechonski, Rafal
Vescovi, Giuliano
Bi, Z.
Mikkelsen, Anders
Samuelsen, Lars
Gundlach, Carsten
Source :: Stankevic , T , Mickevicius , S , Nielsen , M S , Feidenhans'l , R K , Kryliouk , O , Ciechonski , R , Vescovi , G , Bi , Z , Mikkelsen , A , Samuelsen , L & Gundlach , C 2015 , ' Measurement of strain in the InGaN/GaN heterogeneous nanostructures ' , Journal of Applied Crystallography , vol. 48 , no. Part 2 , pp. 344-349 .
Publication Year :: 2015

Database :: OAIster
Journal :: Stankevic , T , Mickevicius , S , Nielsen , M S , Feidenhans'l , R K , Kryliouk , O , Ciechonski , R , Vescovi , G , Bi , Z , Mikkelsen , A , Samuelsen , L & Gundlach , C 2015 , ' Measurement of strain in the InGaN/GaN heterogeneous nanostructures ' , Journal of Applied Crystallography , vol. 48 , no. Part 2 , pp. 344-349 .
Notes :: English
Publication Type :: Electronic Resource
Accession number :: edsoai.on1322669684
Document Type :: Electronic Resource

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