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Fast Strain Mapping of Nanowire Light-Emitting Diodes Using Nanofocused X-ray Beams.
- Source :
- Stankevic , T , Hilner , E K M , Seiboth , F , Ciechonski , R , Vescovi , G , Kryliouk , O , Johansson , U , Samuelsen , L , Wellenreuther , G , Falkenberg , G , Feidenhans'l , R K & Mikkelsen , A 2015 , ' Fast Strain Mapping of Nanowire Light-Emitting Diodes Using Nanofocused X-ray Beams. ' , A C S Nano , vol. 9 , no. 7 , pp. 6978-6984 .
- Publication Year :
- 2015
Details
- Database :
- OAIster
- Journal :
- Stankevic , T , Hilner , E K M , Seiboth , F , Ciechonski , R , Vescovi , G , Kryliouk , O , Johansson , U , Samuelsen , L , Wellenreuther , G , Falkenberg , G , Feidenhans'l , R K & Mikkelsen , A 2015 , ' Fast Strain Mapping of Nanowire Light-Emitting Diodes Using Nanofocused X-ray Beams. ' , A C S Nano , vol. 9 , no. 7 , pp. 6978-6984 .
- Notes :
- English
- Publication Type :
- Electronic Resource
- Accession number :
- edsoai.on1322666592
- Document Type :
- Electronic Resource