Electrical performance and reliability characterization of a SiC MOSFET power module with embedded decoupling capacitors

MLA

Yang, Li, et al. Electrical Performance and Reliability Characterization of a SiC MOSFET Power Module with Embedded Decoupling Capacitors. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsoai&AN=edsoai.on1312910266&authtype=sso&custid=ns315887. Accessed 1 Nov. 2024.

APA

Yang, L., Li, K., Dai, J., Corfield, M., Harris, A., Paciura, K., O’Brien, J., & Johnson, C. M. (n.d.). Electrical performance and reliability characterization of a SiC MOSFET power module with embedded decoupling capacitors.

Chicago

Yang, Li, Ke Li, Jingru Dai, Martin Corfield, Anne Harris, Krzysztof Paciura, John O’Brien, and C. Mark Johnson. 2024. “Electrical Performance and Reliability Characterization of a SiC MOSFET Power Module with Embedded Decoupling Capacitors.” Accessed November 1. http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsoai&AN=edsoai.on1312910266&authtype=sso&custid=ns315887.