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Multispectral imaging sensors integrated on silicon
- Publication Year :
- 2013
-
Abstract
- Quantum dot infrared detectors can be integrated on silicon using droplet epitaxy, enabling the simultaneous detection of multiple wavelengths in a format compatible with current semiconductor technology.
Details
- Database :
- OAIster
- Notes :
- English
- Publication Type :
- Electronic Resource
- Accession number :
- edsoai.on1308913571
- Document Type :
- Electronic Resource