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Neutron and alpha SER in advanced NAND Flash memories

Authors :
Bagatin, M
Gerardin, S
Paccagnella, A
Ferlet Cavrois, V
Visconti, A
Gorini, G
Andreani, C
Frost, C
GORINI, GIUSEPPE
Frost, C.
Bagatin, M
Gerardin, S
Paccagnella, A
Ferlet Cavrois, V
Visconti, A
Gorini, G
Andreani, C
Frost, C
GORINI, GIUSEPPE
Frost, C.
Publication Year :
2013

Abstract

We study the response of NAND Flash memories to neutron and alpha particle exposure, with both Single- and Multi-Level Cell architecture devices. We analyze the error rate in the terrestrial environment and discuss scaling trends

Details

Database :
OAIster
Notes :
STAMPA, English
Publication Type :
Electronic Resource
Accession number :
edsoai.on1308913508
Document Type :
Electronic Resource