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Neutron and alpha SER in advanced NAND Flash memories
- Publication Year :
- 2013
-
Abstract
- We study the response of NAND Flash memories to neutron and alpha particle exposure, with both Single- and Multi-Level Cell architecture devices. We analyze the error rate in the terrestrial environment and discuss scaling trends
Details
- Database :
- OAIster
- Notes :
- STAMPA, English
- Publication Type :
- Electronic Resource
- Accession number :
- edsoai.on1308913508
- Document Type :
- Electronic Resource