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Layer-dependent topological phase in a two-dimensional quasicrystal and approximant.

Authors :
Cain, Jeffrey D
Cain, Jeffrey D
Azizi, Amin
Conrad, Matthias
Griffin, Sinéad M
Zettl, Alex
Cain, Jeffrey D
Cain, Jeffrey D
Azizi, Amin
Conrad, Matthias
Griffin, Sinéad M
Zettl, Alex
Source :
Proceedings of the National Academy of Sciences of the United States of America; vol 117, iss 42, 26135-26140; 0027-8424
Publication Year :
2020

Abstract

The electronic and topological properties of materials are derived from the interplay between crystalline symmetry and dimensionality. Simultaneously introducing "forbidden" symmetries via quasiperiodic ordering with low dimensionality into a material system promises the emergence of new physical phenomena. Here, we isolate a two-dimensional (2D) chalcogenide quasicrystal and approximant, and investigate their electronic and topological properties. The 2D layers of the materials with a composition close to Ta1.6Te, derived from a layered transition metal dichalcogenide, are isolated with standard exfoliation techniques, and investigated with electron diffraction and atomic resolution scanning transmission electron microscopy. Density functional theory calculations and symmetry analysis of the large unit cell crystalline approximant of the quasicrystal, Ta21Te13, reveal the presence of symmetry-protected nodal crossings in the quasicrystalline and approximant phases, whose presence is tunable by layer number. Our study provides a platform for the exploration of physics in quasicrystalline, low-dimensional materials and the interconnected nature of topology, dimensionality, and symmetry in electronic systems.

Details

Database :
OAIster
Journal :
Proceedings of the National Academy of Sciences of the United States of America; vol 117, iss 42, 26135-26140; 0027-8424
Notes :
application/pdf, Proceedings of the National Academy of Sciences of the United States of America vol 117, iss 42, 26135-26140 0027-8424
Publication Type :
Electronic Resource
Accession number :
edsoai.on1287352453
Document Type :
Electronic Resource