Stability of boron-doped graphene/copper interface: DFT, XPS and OSEE studies

MLA

Boukhvalov, D. W., et al. “Stability of Boron-Doped Graphene/Copper Interface: DFT, XPS and OSEE Studies.” Appl Surf Sci, 2018. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsoai&AN=edsoai.on1280535835&authtype=sso&custid=ns315887.

APA

Boukhvalov, D. W., Zhidkov, I. S., Kukharenko, A. I., Slesarev, A. I., Zatsepin, A. F., Cholakh, S. O., & Kurmaev, E. Z. (2018). Stability of boron-doped graphene/copper interface: DFT, XPS and OSEE studies. Appl Surf Sci.

Chicago

Boukhvalov, D. W., I. S. Zhidkov, A. I. Kukharenko, A. I. Slesarev, A. F. Zatsepin, S. O. Cholakh, and E. Z. Kurmaev. 2018. “Stability of Boron-Doped Graphene/Copper Interface: DFT, XPS and OSEE Studies.” Appl Surf Sci. http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsoai&AN=edsoai.on1280535835&authtype=sso&custid=ns315887.