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ULTRARAM:toward the development of a III-V semiconductor, non-volatile, random-access memory

Authors :
Lane, Dominic
Hodgson, Peter
Potter, Richard
Beanland, Richard
Hayne, Manus
Lane, Dominic
Hodgson, Peter
Potter, Richard
Beanland, Richard
Hayne, Manus
Publication Year :
2021

Abstract

ULTRARAMâ„¢ is a III-V compound semiconductor memory concept which exploits quantum resonant tunneling to achieve non-volatility at extremely low switching energy per unit area. Prototype devices are fabricated in a 2x2 memory array formation on GaAs substrates. The devices show 0/1 state contrast from program/erase (P/E) cycles with 2.5 V pulses of 500-µs duration, a remarkable switching speed for a 20 µm gate length. Memory retention is tested for 8x104 s, whereby the 0/1 states show adequate contrast throughout, whilst performing 8x104 readout operations. Further reliability is demonstrated via program-read-erase-read endurance cycling for 106 cycles with 0/1 contrast. A half-voltage array architecture proposed in our previous work is experimentally realized, with an outstandingly small disturb rate over 105 half-voltage cycles.

Details

Database :
OAIster
Notes :
text, text, https://eprints.lancs.ac.uk/id/eprint/152423/1/ULTRARAM_TED_v4.2.pdf, English, English
Publication Type :
Electronic Resource
Accession number :
edsoai.on1261383632
Document Type :
Electronic Resource