Probing surface states of Cu/Ni thin films using x-ray absorption spectroscopy

Authors :: Karis, O
Magnuson, Martin
Wiell, T
Weinelt, M
Wassdahl, N
Nilsson, A
Martensson, N
Holmstrom, E
Niklasson, AMN
Eriksson, O
Johansson, B
Karis, O
Magnuson, Martin
Wiell, T
Weinelt, M
Wassdahl, N
Nilsson, A
Martensson, N
Holmstrom, E
Niklasson, AMN
Eriksson, O
Johansson, B
Publication Year :: 2001
Abstract: Surface and interface properties of Cu thin films (1-4 monolayers) deposited on Ni(100) have been extracted by means of x-ray absorption spectroscopy and analyzed in combination with ab initio density-functional calculations. An unoccupied Cu surface stat

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