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Response of the imaging cameras to hard radiation during JET operation

Authors :
Huber, Alexander
Bergsåker, Henric
Bykov, Igor
Elevant, Thomas
Frassinetti, Lorenzo
Garcia Carrasco, Alvaro
Hellsten, Torbjörn
Ivanova, Darya
Jonsson, Thomas
Menmuir, Sheena
Petersson, Per
Rachlew, Elisabeth
Rubel, Marek
Ström, Petter
Tholerus, Simon
Weckmann, Armin
Zychor, I.
et al.
Huber, Alexander
Bergsåker, Henric
Bykov, Igor
Elevant, Thomas
Frassinetti, Lorenzo
Garcia Carrasco, Alvaro
Hellsten, Torbjörn
Ivanova, Darya
Jonsson, Thomas
Menmuir, Sheena
Petersson, Per
Rachlew, Elisabeth
Rubel, Marek
Ström, Petter
Tholerus, Simon
Weckmann, Armin
Zychor, I.
et al.
Publication Year :
2017

Abstract

The analysis of the radiation damage of imaging systems is based on all different types-of aiialoiue/digital cameras with uncooled as well as actively cooled image sensors in the VIS/NIR/MWIR spectral ranges. The Monte Carlo N-Particle (MCNP) code has been used to determine the neutron fluence at different camera locations in JET. An explicit link between the sensor damage and the neutron fluence has been observed. Sensors show an increased dark-current and increased numbers of hot-pixels. Uncooled cameras must be replaced once per year after exposure to a neutron fluence of similar to 1.9-3.2 x 10(12)neutrons/cm(2). Such levels of fluence will be reached after approximate to 14-22 ELMy H-mode pulses during the future D-T campaign. Furthermore, dynamical noise seen as a random pattern of bright pixels was observed in the presence of hard radiation (neutrons and gammas). Failure of the digital electronics inside the cameras as well as of industrial controllers is observed beyond a neutron fluence of about similar to 4 x 10(9) neutrons/cm(2). The impact of hard radiation on the different types of electronics and possible application of cameras during future D-T campaign is discussed.<br />QC 20200421

Details

Database :
OAIster
Notes :
English
Publication Type :
Electronic Resource
Accession number :
edsoai.on1235029347
Document Type :
Electronic Resource
Full Text :
https://doi.org/10.1016.j.fusengdes.2017.03.167