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Anomalous diffraction effect on the surface core-level photoemission from Si(001)2x1-Cs surface
- Publication Year :
- 1998
-
Abstract
- The angular dependence of the Si 2p photoelectron intensity has been measured for a Cs-saturated Si(001)2 x 1 surface. A surface Si 2p component, which is attributed to the Si-dimer underneath the Cs overlayer, shows a large intensity variation as a funct<br />Addresses: Abukawa T, Tohoku Univ, Sci Measurements Res Inst, Sendai, Miyagi 98077, Japan. Tohoku Univ, Sci Measurements Res Inst, Sendai, Miyagi 98077, Japan. Univ Dortmund, D-44221 Dortmund, Germany. Univ Lausanne, Inst Phys Expt, CH-1015 Lausanne, Swit
Details
- Database :
- OAIster
- Notes :
- English
- Publication Type :
- Electronic Resource
- Accession number :
- edsoai.on1234717988
- Document Type :
- Electronic Resource