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P2M : First Optical Characterisation Results of a 2MPixel CMOS Image Sensor for Soft X-Ray Detection

Authors :
Sedgwick, I.
Marras, A.
Wunderer, C. B.
Correa, J.
Lange, S.
Boitrelle, B.
Orsini, F.
Kuhn, M.
Krivan, F.
Shevyakov, I.
Zimmer, M.
Guerrini, N.
Marsh, B.
Cautero, G.
Giuressi, D.
Menk, R.
Pinaroli, G.
Stebel, L.
Greer, A.
Nicholls, T.
Pedersen, U.
Tartoni, N.
Rah, S. Y.
Hyun, H. J.
Kim, K. S.
Graafsma, Heinz
Sedgwick, I.
Marras, A.
Wunderer, C. B.
Correa, J.
Lange, S.
Boitrelle, B.
Orsini, F.
Kuhn, M.
Krivan, F.
Shevyakov, I.
Zimmer, M.
Guerrini, N.
Marsh, B.
Cautero, G.
Giuressi, D.
Menk, R.
Pinaroli, G.
Stebel, L.
Greer, A.
Nicholls, T.
Pedersen, U.
Tartoni, N.
Rah, S. Y.
Hyun, H. J.
Kim, K. S.
Graafsma, Heinz
Publication Year :
2019

Abstract

High brilliance synchrotrons and FELs require high performing detector systems to realise their full potential. High dynamic range, low noise and high frame rate are all of great importance. In this paper we present first optical characterization results of the P2M CMOS sensor, designed for soft X-ray detection at such facilities. Previous work is summarised and an overview of the sensor is presented. Test results for the sensor's column-parallel ADC and readout chain are presented, and first test results for the pixel acquired using the Photon Transfer Curve (PTC) method are shown. Finally, an outline of future work is provided.

Details

Database :
OAIster
Notes :
English
Publication Type :
Electronic Resource
Accession number :
edsoai.on1233764803
Document Type :
Electronic Resource
Full Text :
https://doi.org/10.1109.NSS.MIC42101.2019.9059636