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Local-environment approach for deep-level defects in semiconductors: Application to the vacancy in silicon

Authors :
Yong-Liang, Wang
Lindefelt, Ulf
Yong-Liang, Wang
Lindefelt, Ulf
Publication Year :
1988

Details

Database :
OAIster
Notes :
English
Publication Type :
Electronic Resource
Accession number :
edsoai.on1233573456
Document Type :
Electronic Resource

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