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High Precision Refraction Measurements By Solar Imaging During Occultation: Results From Sofie

Authors :
Electrical and Computer Engineering
Gordley, Larry L.
Burton, J.
Marshall, B. T.
McHugh, M.
Deaver, L.
Nelsen, J.
Russell, James M. III
Bailey, Scott M.
Electrical and Computer Engineering
Gordley, Larry L.
Burton, J.
Marshall, B. T.
McHugh, M.
Deaver, L.
Nelsen, J.
Russell, James M. III
Bailey, Scott M.
Publication Year :
2009

Abstract

A new method for measuring atmospheric refraction angles is presented, with in-orbit measurements demonstrating a precision of +/-0.02 arcsec (+/-0.1 mu rad). Key advantages of the method are the following: (1) Simultaneous observation of two celestial points during occultation (i.e., top and bottom edges of the solar image) eliminates error from instrument attitude uncertainty. (2) The refraction angle is primarily a normalized difference measurement, causing only scale error, not absolute error. (3) A large number of detector pixels are used in the edge location by fitting to a known edge shape. The resulting refraction angle measurements allow temperature sounding up to the lower mesosphere. (C) 2009 Optical Society of America

Details

Database :
OAIster
Notes :
English
Publication Type :
Electronic Resource
Accession number :
edsoai.on1199306724
Document Type :
Electronic Resource