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Sequence searching with deep-learnt depth for condition-and viewpoint-invariant route-based place recognition

Authors :
Grauman, K
Torralba, A
Zisserman, A
Learned-Miller, E
Milford, Michael
Lowry, Stephanie
Suenderhauf, Niko
Shirazi, Sareh
Pepperell, Edward
Upcroft, Ben
Shen, Chunhua
Lin, Guosheng
Liu, Fayao
Cadena, Cesar
Reid, Ian
Grauman, K
Torralba, A
Zisserman, A
Learned-Miller, E
Milford, Michael
Lowry, Stephanie
Suenderhauf, Niko
Shirazi, Sareh
Pepperell, Edward
Upcroft, Ben
Shen, Chunhua
Lin, Guosheng
Liu, Fayao
Cadena, Cesar
Reid, Ian
Source :
Proceedings of the 2015 IEEE Conference on Computer Vision and Pattern Recognition Workshops (CVPRW 2015)
Publication Year :
2015

Abstract

Vision-based localization on robots and vehicles remains unsolved when extreme appearance change and viewpoint change are present simultaneously. The current state of the art approaches to this challenge either deal with only one of these two problems; for example FAB-MAP (viewpoint invariance) or SeqSLAM (appearance-invariance), or use extensive training within the test environment, an impractical requirement in many application scenarios. In this paper we significantly improve the viewpoint invariance of the SeqSLAM algorithm by using state-of-the-art deep learning techniques to generate synthetic viewpoints. Our approach is different to other deep learning approaches in that it does not rely on the ability of the CNN network to learn invariant features, but only to produce“good enough” depth images from day-time imagery only. We evaluate the system on a new multi-lane day-night car dataset specifically gathered to simultaneously test both appearance and viewpoint change. Results demonstrate that the use of synthetic viewpoints improves the maximum recall achieved at 100% precision by a factor of 2.2 and maximum recall by a factor of 2.7, enabling correct place recognition across multiple road lanes and significantly reducing the time between correct localizations.

Details

Database :
OAIster
Journal :
Proceedings of the 2015 IEEE Conference on Computer Vision and Pattern Recognition Workshops (CVPRW 2015)
Publication Type :
Electronic Resource
Accession number :
edsoai.on1146607425
Document Type :
Electronic Resource