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Reduction of variability in aircraft manufacturing using photogrammetry as an inspection tool

Authors :
David H. Staelin and Roy E. Welsch.
Massachusetts Institute of Technology. Dept. of Mechanical Engineering
Sloan School of Management
Lee, Deishin
David H. Staelin and Roy E. Welsch.
Massachusetts Institute of Technology. Dept. of Mechanical Engineering
Sloan School of Management
Lee, Deishin
Publication Year :
2005

Abstract

Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, and (M.S.)--Massachusetts Institute of Technology, Sloan School of Management, 1992.<br />Includes bibliographical references (leaf 59).<br />by Deishin Lee.<br />M.S.

Details

Database :
OAIster
Notes :
76 leaves, 5673357 bytes, 5673114 bytes, application/pdf, English
Publication Type :
Electronic Resource
Accession number :
edsoai.on1139049892
Document Type :
Electronic Resource