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Analysis of the fault-tolerance capacity of the multilevel active-clamped converter

Authors :
Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica
Escola Tècnica Superior d'Enginyeria Industrial de Barcelona
Universitat Politècnica de Catalunya. GREP - Grup de Recerca en Electrònica de Potència
Nicolás Apruzzese, Joan
Busquets Monge, Sergio
Bordonau Farrerons, José
Alepuz Menéndez, Salvador
Calle Prado, Alejandro
Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica
Escola Tècnica Superior d'Enginyeria Industrial de Barcelona
Universitat Politècnica de Catalunya. GREP - Grup de Recerca en Electrònica de Potència
Nicolás Apruzzese, Joan
Busquets Monge, Sergio
Bordonau Farrerons, José
Alepuz Menéndez, Salvador
Calle Prado, Alejandro
Publication Year :
2013

Abstract

Thanks to the inherent redundancy to generate the different output voltage levels, the multilevel active-clamped (MAC) topology presents an important fault-tolerance ability which makes it interesting for several applications. This paper presents an analysis of the fault-tolerance capacity of the MAC converter. Both open-circuit and short-circuit faults are considered, and the analysis is carried out under single-device and two simultaneous device faults. Switching strategies and different hardware modifications to overcome the limitations caused by faults are proposed. Experimental tests with a four-level MAC prototype are presented to validate the analysis.<br />Postprint (published version)

Details

Database :
OAIster
Notes :
11 p., application/pdf, English
Publication Type :
Electronic Resource
Accession number :
edsoai.on1132970361
Document Type :
Electronic Resource