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Ion implanted MOS transistors

Authors :
UCL
Demoulin, E.
Van de Wiele, F.
Proceedings of the NATO Advanced Study Institute on Process and Device Modelling for Integrated Circuit Design
UCL
Demoulin, E.
Van de Wiele, F.
Proceedings of the NATO Advanced Study Institute on Process and Device Modelling for Integrated Circuit Design
Publication Year :
1977

Abstract

A review of the principal features of ion implanted transistors is presented. A detailed analysis of the threshold voltage shift is given, with emphasis directed towards dose and energy effects. Analytical expressions are derived for enhancement mode devices and compared with numerical solutions; the effect of the implantation on subthreshold currents is described. Some aspects of depletion mode transistors are treated.<br />Anglais

Details

Database :
OAIster
Notes :
English
Publication Type :
Electronic Resource
Accession number :
edsoai.on1130543853
Document Type :
Electronic Resource