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Toward reliable MIS- and MOS-gate structures for GaN power devices
- Authors :
- Chen, Kevin J.
Yang, Shu
Liu, Shenghou
Liu, Cheng
Hua, Mengyuan
Tang, Zhikai
Chen, Kevin J.
Yang, Shu
Liu, Shenghou
Liu, Cheng
Hua, Mengyuan
Tang, Zhikai
- Publication Year :
- 2015
Details
- Database :
- OAIster
- Notes :
- English
- Publication Type :
- Electronic Resource
- Accession number :
- edsoai.on1125186069
- Document Type :
- Electronic Resource