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The electronic component authenticity verification

Authors :
Neumann, Petr
Navrátil, Milan
Pospíšilík, Martin
Křesálek, Vojtěch
Adámek, Milan
Neumann, Petr
Navrátil, Milan
Pospíšilík, Martin
Křesálek, Vojtěch
Adámek, Milan
Publication Year :
2018

Abstract

The article presents a brief insight into the university research of efficient methods aimed at revealing counterfeit electronic components. Methods like multichannel curve tracing, component internal structure X-raying, system on chip optical inspection with higher magnification microscopy and Scanning Electron Microscopy combined with Element Energy Dispersive Spectroscopy (EDS) are powerful means for authenticity verification. Comparative analysis results serve as an illustration of cases where various features differences can warn not to let a particular component delivery penetrate the assembly process. © 2018 Institute of Physics Publishing. All rights reserved.

Details

Database :
OAIster
Notes :
English
Publication Type :
Electronic Resource
Accession number :
edsoai.on1085679616
Document Type :
Electronic Resource