Back to Search
Start Over
Optoelectronic properties of CuPc thin films deposited at different substrate temperatures
- Publication Year :
- 2009
-
Abstract
- Structural and optical characterization of copper phthalocyanine thin film thermally deposited at different substrate temperatures was the aim of this work. The morphology of the films shows strong dependence on temperature, as can be observed by atomic force microscopy and x-ray diffraction spectroscopy, specifically in the grain size and features of the grains. The increase in the crystal phase with substrate temperature is shown by x-ray diffractometry. Optical absorption coefficient measured by photothermal deflection spectroscopy and optical transmittance reveal a weak dependence on the substrate temperature. Besides, the electro-optical response measured by the external quantum efficiency of Schottky ITO/CuPc/Al diodes shows an optimized response for samples deposited at a substrate temperature of 60¿°C, in correspondence to the I–V diode characteristics.<br />Peer Reviewed<br />Postprint (published version)
Details
- Database :
- OAIster
- Notes :
- 6 p., application/pdf, English
- Publication Type :
- Electronic Resource
- Accession number :
- edsoai.on1073029606
- Document Type :
- Electronic Resource