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Charge Mobility and Dynamics in Spin-Crossover Nanoparticles Studied by Time-Resolved Microwave Conductivity

Authors :
Dugay, J. (author)
Evers, W.H. (author)
Torres-Cavanillas, Ramón (author)
Giménez-Marqués, Mónica (author)
Coronado, Eugenio (author)
van der Zant, H.S.J. (author)
Dugay, J. (author)
Evers, W.H. (author)
Torres-Cavanillas, Ramón (author)
Giménez-Marqués, Mónica (author)
Coronado, Eugenio (author)
van der Zant, H.S.J. (author)
Publication Year :
2018

Abstract

We use the electrodeless time-resolved microwave conductivity (TRMC) technique to characterize spin-crossover (SCO) nanoparticles. We show that TRMC is a simple and accurate means for simultaneously assessing the magnetic state of SCO compounds and charge transport information on the nanometer length scale. In the low-spin state from liquid nitrogen temperature up to 360 K the TRMC measurements present two well-defined regimes in the mobility and in the half-life times, in which the former transition temperature TR occurs near 225 K. Below TR, we propose that an activationless regime taking place associated with short lifetimes of the charge carriers points at the presence of shallow-trap states. Above TR, these states are thermally released, yielding a thermally activated hopping regime where longer hops increase the mobility and, concomitantly, the barrier energy. The activation energy could originate not only from intricate contributions such as polaronic self-localizations but also from dynamic disorder due to phonons and/or thermal fluctuations of SCO moieties.<br />Green Open Access added to TU Delft Institutional Repository ‘You share, we take care!’ – Taverne project https://www.openaccess.nl/en/you-share-we-take-care Otherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public.<br />QN/van der Zant Lab<br />BN/Technici en Analisten

Details

Database :
OAIster
Notes :
English
Publication Type :
Electronic Resource
Accession number :
edsoai.on1062420230
Document Type :
Electronic Resource
Full Text :
https://doi.org/10.1021.acs.jpclett.8b02267